X-ray fluorescence (XRF) spectrometry is a powerful analytical technique for elemental analysis of a wide variety of materials in a highly precise and generally non-destructive way. XRF can be used for many elemental analysis applications, such as electronics, plastics, rubbers, geology, forensics, and WEEE / RoHS / ELV compliance testing.
The XRF instrument at ITL is a bench-top energy dispersive x-ray fluorescence (EDXRF) spectrometer. The EDXRF can be used to measure virtually every element from sodium (Na) to uranium (U) in the periodic table, in concentrations ranging from ppm levels to nearly 100 percent by weight. It can be used for monitoring major components in a product or process or the addition of minor additive. Two of the most important characteristics of the EDXRF are minimum sample preparation and its capability to provide rapid, real-time multi-element analysis on many types of samples, such as solids, liquids, powders, thin films, slurries, and pastes. Because of these advantages, the technique has a broad appeal to many industries.
The EDXRF at ITL is also capable of performing high precision analysis of an area of 0.1 mm or 1.2 mm in diameter. The combination of its large sample chamber and small X-ray beam diameter provides compatibility with a wide range of sample sizes, from small parts to large products. Elemental content in products and parts can be measured with no sample preparation.
Simultaneous Pb/Cd/Cr/Hg/Br Analysis
Compliant with WEEE and RoHS Directives