Surface Analysis
Control and investigation of the main physical and chemical properties of solid surfaces and thin multilayering are important problems when dealing with nano technology. The distribution of elements and structural defects determine the quality, reliability, and lifetime of different electronic devices. Control can be realized by use of destructive and non-destructive methods.
ITL Inc. has vast experience in surface analysis, depositions of multilayer films and development of nondestructive layer-by-layer methods of the main physical-chemical properties of the solid surfaces based on the probe of the surface electron beams. The measurements are conducted according to ASTM and ISO standards and/or custom designed methods.
A number of measurement methods are unique and offered only by ITL. Surface Science Department consists of two directions: Thin Films Deposition and Surface Analysis.
ITL also offers on a regular basis a two-day course “Introduction to Surface Analysis” for industry.
Among the modern surface analysis techniques that ITL scientists are using one can mention:
Equipment
- Auger Electron Spectroscopy
- Scanning Electron Microscopy (SEM) combined with Energy Dispersive Spectroscopy (EDS)
- Contact Angle Measurement
- Residual Gas Mass Spectrometry
- Attenuated Total Reflectance – Fourier Transform Infrared Spectroscopy (ATR-FTIR)
- Optical Interferometry / Profilometry
- Surface Roughness Measurement
