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NEWS

1. New XRF spectrometer -compliant with RoHS/WEEE Directives

2. International Space Conference ICPMSE-11, Lijiang, China, 19-23 May, 2014

Testing Capabilities

Accelerated Weathering Testing        
Auger Surface Analysis
Carbon/Sulfur Elemental Analysis
Contact Angle Measurement
Contamination Outgassing Testing
Differential Scanning Calorimetry (DSC)
Fourier Transform Infrared Spectroscopy (FTIR)
High Temperature Thermophysical Analysis
Inductively Coupled Plasma Atomic Emission Spectroscopy (ICP-AES / ICP-OES)
Infrared Reflectometry
Mechanical Testing (Tensile, Compression, Peel Adhesion, Pull, Shear, Flexure)
Microhardness Measurement (Vickers and Knoop)
Optical Interferometry/Profilometry
Residual Stress Measurement and Management (Ultrasonic Peening)
Rockwell / Superficial Rockwell Hardness Measurement
Salt Spray (Fog) Testing
Scanning Electron Microscopy (SEM) / Energy Dispersive X-ray Spectroscopy (EDS)
Space Environment Simulation (AO, VUV, Plasma Asher)
Surface Modification Technologies
Surface Treatment (Corona, UV, Plasma, AO)
Surface Roughness Measurement
Temperature / Humidity Testing
Thermal Cycling Testing
Thermomechanical Analysis (TMA)
Thermogravimetric Analysis (TGA)
Thin Film Deposition (E-beam, RF Magnetron Sputtering, Thermal PVD, CVD)
UV-VIS-IR Spectroscopy
Viscosity Measurement
X-ray Fluorescence Spectrometry (XRF)
X-ray Inspection and Imaging

 

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